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Universal Probe Stand

Highly repeatable needle contact conditions.
Individually adjustable needle loadings with direct indication of set load.
Micrometer controlled slice displacement.
4-point measurement of wafer resistivity and 3-point spreading resistance measurements.
Hinged steel cover to eliminate effects of light and electrical interference.

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Amplifier
Generator
New Era Pumps
Spellman High Voltage Supplies
Glass Chemical Reactors
High Pressure Autoclave
Solar Test System
Microfluidics Devices
Confocal Raman Microscope
Four Point Probe
  System
  Test Unit
  Probe Stand
  Applications
Potentiostat / Galvanostat / ZRA
Hall Effect Measurement
High Pressure Homogenizer
Battery Cycler
Cryogenics
Avantes Spectrophotometers

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