The NS-3600 is a high-speed confocal laser scanning microscope (CLSM) designed for precise and reliable 3D measurements, tailored for laboratory use. It generates three-dimensional representations of target objects by directly converting optically sectioned images into 3D profile data using a straightforward algorithm. The unique raw cross-sectional images offer intuitive interpretation and deliver surface profile data that surpasses the quality provided by other optical technologies, making the NS-3600 an exceptional tool for detailed surface analysis and research applications.
Features:
- High resolution nondestructive optical 3D measurement
- Real time confocal imaging
- Various optical zoom
- Simultaneous bright field and confocal imaging
- Automatic gain search with fine auto focus
- Inclination compensation
- Easy analysis mode
- Precise and reliable high-speed height measurement
- Inspection of features through semi-transparent substrate
- No sample preparation
- Image stitching for wide range inspection
Applications:
- Semiconductor : IC pattern, bump height, wire loop height, defect inspection, CMP process
- FPD product : Touch panel screen inspection, ITO pattern, LCD column spacer height
- MEMS device : 3D profile of structure, surface roughness, MEMS pattern
- Glass surfaces : Thin film solar cell, solar cell texture, laser pattern
- Material researches : Tooling surface inspection, roughness, crack analysis