The WITec alpha300 A atomic force microscope (AFM) provides high-resolution nanoscale imaging and is integrated with an optical microscope for superior access and alignment. This system allows seamless switching between various imaging techniques, such as confocal Raman imaging, fluorescence, luminescence, polarization analysis, bright field, dark field, SNOM, and more, simply by rotating the microscope turret. The flexibility to combine multiple imaging methods in one system enhances the depth of surface characterization for advanced research and analysis.
Features:
- Surface characterization on the nanometer scale
- Lateral resolution: down to 1 nm
- Depth resolution: < 0.3 nm
- Wide range of AFM modes included
- User-friendly sample access from any direction
- Ease-of-use in air and liquids
- Unique cantilever technique for convenient cantilever exchange and alignment
- Precise TrueScan™ controlled scan stages with a selectable scan range
- Non-destructive imaging technique with minimal, if any, sample preparation
- Upgradeable with confocal Raman imaging and Nearfield-Microscopy (SNOM) in one microscope
Applications:
- Nanotechnology: Characterizing nanoscale materials and structures.
- Materials Science: Studying thin films, coatings, and nanomaterials.
- Semiconductors: Inspecting microelectronics and semiconductor components at the nanoscale.
- Biotechnology: Analyzing biological samples, such as cells, proteins, and DNA, at high resolution.
- Surface Science: Investigating surface roughness, topography, and mechanical properties of materials.