The alpha300 RA integrates Raman spectroscopy with Atomic Force Microscopy (AFM), providing a powerful tool for both chemical and nanoscale structural imaging. This unique combination allows for correlative Raman-AFM imaging, enabling users to analyze both the chemical composition and surface topography of their samples in a single, seamless system.
Features:
- Chemical Imaging: Utilizes the alpha300 R’s Raman microscope for in-depth chemical composition analysis.
- Nanoscale Structural Imaging: Employs the alpha300 A’s AFM for high-resolution surface characterization.
- Correlative Analysis: Combines the strengths of both techniques for a comprehensive view of the sample, revealing detailed chemical and structural information simultaneously.
Applications:
- Material Science: Characterizing advanced materials, polymers, and composites by correlating their chemical and mechanical properties.
- Nanotechnology: Investigating nanoscale materials, devices, and coatings for research and development.
- Biological Research: Studying cells, tissues, and biomaterials to understand their chemical composition and surface morphology.
- Semiconductor Industry: Analyzing thin films, coatings, and other semiconductor materials with both chemical and structural insights.