Correlative Raman and Scanning Near-field Optical Microscopy
The alpha300 RS is the ideal solution for users with challenging experimental requirements, offering the powerful combination of confocal Raman imaging and Scanning Near-field Optical Microscopy (SNOM) for optical imaging beyond the diffraction limit. This advanced system integrates all the features of the alpha300 S (SNOM) and alpha300 R (Raman), along with various AFM operation modes, enabling a wide range of imaging capabilities.
Features:
- High-resolution Raman imaging through nearfield Raman techniques, providing detailed chemical analysis at the nanoscale.
- SNOM capabilities, allowing for optical imaging with resolution beyond the diffraction limit, offering superior spatial resolution.
- Flexible operation modes, combining Raman spectroscopy, SNOM, and AFM for comprehensive sample analysis.
Applications:
- Nanotechnology: Studying nanoscale structures and materials with both chemical and optical insights.
- Materials Science: Analyzing surface properties and composition of advanced materials and coatings.
- Biological Research: Investigating cells and tissues with high spatial resolution, combining chemical and morphological information.
- Semiconductor Research: Characterizing semiconductor materials at the nanoscale for device development and quality control.