The WITec alpha300 S is an advanced, user-friendly Scanning Near-field Optical Microscope (SNOM) that combines SNOM, confocal microscopy, and Atomic Force Microscopy (AFM) in one system. Users can effortlessly switch between these modes by rotating the objective turret. The alpha300 S utilizes micro-fabricated SNOM cantilever sensors, allowing optical microscopy with spatial resolution beyond the diffraction limit. This makes it an excellent tool for high-resolution imaging at the nanoscale, ideal for advanced research in fields like nanotechnology, materials science, and biology.
Features:
- Spatial resolution beyond the diffraction limit (ca. 60 nm laterally)
- Unique patented SNOM sensor technique
- Ease-of-use in air and liquids
- Various Atomic Force Microscopy modes included
- Non-destructive imaging technique with minimal, if any, sample preparation
- Upgradeable with confocal Raman imagingin one microscope
Applications:
- Nanotechnology: Provides high-resolution imaging to explore nanoscale structures and materials.
- Materials Science: Used for surface characterization, material properties analysis, and failure analysis of materials.
- Biology and Life Sciences: Helps in cellular imaging, tissue analysis, and understanding biological interactions at the nanoscale.
- Semiconductor Industry: Offers critical insights into microelectronics and semiconductor device testing.