The PanEL-Spot: EL-Camera Lab System by Brightspot Automation is a specialized system for performing electroluminescence (EL) imaging in lab environments. It is primarily used for analyzing materials such as solar cells, semiconductors, and displays under electrical stress or operating conditions. The system utilizes a camera-based setup to capture the emitted light from the sample when subjected to an electrical current, helping to identify defects, hotspots, and efficiency losses.
Electroluminescence imaging of cell/panel defects
- Cracks in silicon solar cells
- Cell processing defects (e.g. broken fingers)
- Silicon quality (lifetime) variations
- Wire soldering problems
- Potential Induced Degradation
- Thin-Film Shunting
- Upgrade to PL mode without contacting
Applications:
- Solar Cells: Efficiency and defect testing.
- OLED Displays: Uniformity and defect detection.
- Semiconductors: Research, failure analysis, and material characterization.
- Material Science: Development and characterization of electroluminescent materials.
- Quality Control: Manufacturing line inspection of light-emitting products.
- Automotive and Aerospace: Testing lighting systems and components.
- Consumer Electronics: Screen quality control and testing.