RISE Microscopy: World’s First Fully Integrated Raman Imaging and Scanning Electron Microscopes
RISE Microscopy is a groundbreaking correlative microscopy technique that combines Scanning Electron Microscopy (SEM) and confocal Raman Imaging in a single, fully integrated system. This innovative approach enables researchers to seamlessly link ultra-structural surface properties observed through SEM with molecular compound information provided by Raman spectroscopy.
Key benefits of RISE Microscopy:
- Correlative imaging: Effortlessly correlate high-resolution SEM surface morphology with detailed chemical composition from Raman imaging.
- Enhanced analysis: Ideal for materials science, nanotechnology, and life sciences, where both structural and chemical characterization are essential.
- Comprehensive insights: Provides a deeper understanding of complex samples, revealing both their physical structure and chemical composition in a single workflow.
Applications:
- Nanotechnology: Detailed characterization of nanoscale materials.
- Material Science: Investigating complex composites and structural interfaces.
- Life Sciences: Studying biological samples with enhanced molecular detail.
- Semiconductor Research: Correlating structural defects with chemical compositions.
- Forensics and Geosciences: Identifying trace materials with precision.